Screen

Yield Inspection Dashboard

Interactive insights list with ranked review metrics and a sliding highlight.

In-line Yield Inspection

Yield insights backed byproduction models.

Yield Inspection Overview

In-line assessment powered by fab-native inspection models.

98%

Defect Capture Rate

Killer defects caught before they leave the line.

40M+

Dies Classified Daily

Classified across high-volume manufacturing.

6.2x

Faster Review Cycles

Each cycle spent on classifications that protect yield.

In-line

High-volume Manufacturing

Semiconductor manufacturing worldwide.

Design assets for the AI era. Shippable surface so you don’t ship the default look.

Product

Resources

Company

Account